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Citation
Jong-Chul Yoon, and In-Kwon Lee, "Random Offset Curves and Surfaces with Controllabel Noise", In Proceedings of the Israel-Korea Bi-National Conference on New Technologies and Visualization Methods for Product Development on Design and Reverse Engineering 2005, Haifa, Israel, Nov 7, 2005, November 2005
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Abstract
We introduce a novel parametric representation called ROPN (Random Offset Parametric representation with Noise), which is useful to represent a family of shapes sharing similar complex patterns often being able to be defined with the gradient noise functions. ROPN is defined by replacing a static offset distance in a general offset with a gradient noise function.
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